|
BK2020011876
|
|
真空熔炼 |
BK2020011876-01 |
真空熔炼 |
|
询价
|
|
BK2020011877
|
|
工艺模拟 |
BK2020011877-04 |
GLEEBLE 1500热模拟 |
BK2020011877-03 |
冷轧试验 |
BK2020011877-02 |
热轧模拟 |
BK2020011877-01 |
连退模拟 |
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询价
|
|
BK2020011878
|
|
相变实验 |
BK2020011878-05 |
膨胀仪 |
BK2020011878-04 |
线膨胀系数 |
BK2020011878-03 |
TTT曲线 |
BK2020011878-02 |
CCT曲线 |
BK2020011878-01 |
相变点 |
|
询价
|
|
BK2020011879
|
|
金属热处理 |
BK2020011879-06 |
GLEEBLE 3500热模拟 |
BK2020011879-05 |
热处理炉子 |
BK2020011879-04 |
回火 |
BK2020011879-03 |
淬火 |
BK2020011879-02 |
退火 |
BK2020011879-01 |
正火 |
|
询价
|
|
BK2020011880
|
|
金相组织分析 |
BK2020011880-06 |
脱碳层及渗层 |
BK2020011880-05 |
碳化物 |
BK2020011880-04 |
晶粒度 |
BK2020011880-03 |
夹杂物 |
BK2020011880-02 |
偏光和相衬 |
BK2020011880-01 |
组织观察分析 |
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询价
|
|
BK2020011701
|
|
微区力学性能分析 |
BK2020011701-03 |
原位疲劳 |
BK2020011701-02 |
压痕测试 |
BK2020011701-01 |
AFM原子力显微镜 |
|
询价
|
|
BK2020011702
|
|
电镜样品制备 |
BK2020011702-03 |
聚焦离子束系统(FIB) |
BK2020011702-02 |
喷碳 |
BK2020011702-01 |
离子减薄 |
|
询价
|
|
BK2020011703
|
|
X射线光电子能谱分析XPS |
BK2020011703-03 |
固体表面分析 |
BK2020011703-02 |
定量分析 |
BK2020011703-01 |
XPS定性分析 |
|
询价
|
|
BK2020011704
|
|
X射线衍射分析XRD |
BK2020011704-07 |
X射线衍射 |
BK2020011704-06 |
显微结晶学分析 |
BK2020011704-05 |
取向分析 |
BK2020011704-04 |
晶粒尺寸测定 |
BK2020011704-03 |
应力测定 |
BK2020011704-02 |
点阵常数测定 |
BK2020011704-01 |
物相分析 |
|
询价
|
|
BK2020011705
|
|
透射电子显微分析TEM |
BK2020011705-05 |
|
BK2020011705-04 |
能谱分析EDS |
BK2020011705-03 |
明暗场像 |
BK2020011705-02 |
选区电子衍射 |
BK2020011705-01 |
高分辨电子显微观察 |
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询价
|
|
BK2020011706
|
|
扫描电子显微分析SEM |
BK2020011706-04 |
EBSD |
BK2020011706-03 |
断口形貌分析 |
BK2020011706-02 |
微区元素分析 |
BK2020011706-01 |
表面形貌观察 |
|
询价
|
|